An automatic electropolishing supervisor for preparing field ion microscope specimens
- 1 September 1967
- journal article
- research article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 44 (9) , 808-809
- https://doi.org/10.1088/0950-7671/44/9/447
Abstract
A device is described which supervises the electropolishing of field-ion microscope specimens. It switches off the polishing current when the specimen is ready, thus preventing the blunting of the tip.This publication has 1 reference indexed in Scilit:
- A field ion microscope study of some tungsten-rhenium alloysPhilosophical Magazine, 1963