DC and microwave performance of a GaN/AlGaN MOSHFET under high temperature stress
- 22 January 2002
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 46 (8) , 1211-1214
- https://doi.org/10.1016/s0038-1101(02)00015-1
Abstract
No abstract availableKeywords
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