Formation of the accumulation layer in polymer field-effect transistors
- 3 March 2003
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 82 (9) , 1482-1484
- https://doi.org/10.1063/1.1556564
Abstract
We present an experimental study of charge transfer in polymer thin-film field-effect devices. The rearrangement of the charge-carrier density in the transistor channel upon a gate-voltage swing has been monitored in real time and space by means of noncontact scanning potentiometry. The experimental results are in excellent agreement with a simple theory, in which the charging currents are assumed to be driven by drift in the self-induced electric field. The charge density exponentially approaches its final value with a time constant given by L2/μ|Vg|π2, where L is the characteristic device dimension, μ the field-effect mobility, and Vg the final gate voltage.This publication has 5 references indexed in Scilit:
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