Calculation of X-ray grid characteristics by Monte Carlo methods

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Abstract
The performance of X-ray grids has generally been evaluated experimentally. A theoretical method has been developed by which photon histories are generated by Monte Carlo methods. The probability of penetrating the grid is calculated for each photon escaping from the object towards the detector. The scatter transmission of the grid is determined as the average of these individual probabilities. Results for linear and cross grids are in good agreement with measurements. The method is applicable to arbitrary irradiation and grid parameters. The dependence of scatter transmission values on the irradiation parameters is shown. Grids with linear and zigzag strip patterns are compared in order to demonstrate that even grids that cannot at present be manufactured can nevertheless be evaluated.

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