Efficiency calibration of semiconductor detectors in the X-ray region
- 1 September 1973
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 112 (1-2) , 239-241
- https://doi.org/10.1016/0029-554x(73)90801-x
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Accurate efficiency calibration and properties of semiconductor detectors for low-energy photonsNuclear Instruments and Methods, 1973
- Calibration of the efficiency of a Si(Li) photon spectrometer in the energy region 5 to 125 keVNuclear Instruments and Methods, 1971
- On the efficiency calibration of semiconductor X ray detectorsNuclear Instruments and Methods, 1971
- Digital methods of photopeak integration in activation analysisAnalytical Chemistry, 1971