Structural characterization of amorphous silicon multilayer interfaces
- 1 December 1989
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 114, 774-776
- https://doi.org/10.1016/0022-3093(89)90716-3
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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