X-Ray reflection studies on the monolayer-mediated growth of mesostructured MCM-41 silica at the air/water interface
- 1 January 1998
- journal article
- research article
- Published by Royal Society of Chemistry (RSC) in Chemical Communications
- No. 7,p. 829-830
- https://doi.org/10.1039/a800777b
Abstract
X-Ray reflection has been used to study the nucleation and growth of thin films of a silica–surfactant mesophase (MCM-41) at the air/water interface in the presence and absence of an insoluble lipid monolayer of phosphatidylcholine; the rate of self-assembly and structural order of films comprising up to four micellar layers were enhanced under the lipid monolayer.Keywords
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