Use of surface plasma waves for determination of the thickness and optical constants of thin metallic films
- 1 February 1981
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 71 (2) , 189-191
- https://doi.org/10.1364/josa.71.000189
Abstract
The surface plasma wave technique for determining the dielectric constant ∊(ω) and the thickness d of a metal film without a preset expression for ∊(ω) is discussed. Two sets of solutions can be derived at a given frequency. By comparing d determined at another frequency, the correct ∊(ω) and d solution can be determined.Keywords
This publication has 8 references indexed in Scilit:
- Surface plasma wave study of submonolayer Cs and CsO covered Ag surfacesSurface Science, 1980
- Refractive index of LiF films as a function of timeApplied Optics, 1979
- Use of surface plasmon excitation for determination of the thickness and optical constants of very thin surface layersSurface Science, 1979
- Surface plasma oscillations at silver surfaces with thin transparent and absorbing coatingsSurface Science, 1978
- Surface polaritons—propagating electromagnetic modes at interfacesJournal of Vacuum Science and Technology, 1974
- Die Bestimmung optischer Konstanten von Metallen durch Anregung von OberflächenplasmaschwingungenThe European Physical Journal A, 1971
- The Optical Constants of Silver, Gold, Copper, and Aluminum I The Absorption Coefficient kJournal of the Optical Society of America, 1954
- Optical Constants of Silver, Gold, Copper, and Aluminum II The Index of Refraction nJournal of the Optical Society of America, 1954