Measurement of roughness-induced wavelength corrections to the surface-plasmon resonance in silver
- 1 August 1980
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 70 (8) , 1020-1023
- https://doi.org/10.1364/josa.70.001020
Abstract
A systematic study has been made of the wavelength position of the surface-plasmon resonance in roughened silver foils. Frequency shifts in the resonance peak, produced by varying surface-roughness parameters, have been interpreted using a model calculation. A self-consistent comparison has been made with angular scattered-light distributions from the same foils. Remarks are given concerning changes in silver reflectivity due to annealing.Keywords
This publication has 7 references indexed in Scilit:
- Vector Scattering TheoryOptical Engineering, 1979
- Effects of surface roughness on the surface-polariton dispersion relationPhysical Review B, 1976
- Scattering and absorption of electromagnetic radiation by a semi-infinite medium in the presence of surface roughnessPhysical Review B, 1975
- Light scattering from rough surfacesPhysical Review B, 1975
- Radiation from surface plasmons propagating on rough metal surfacesOptics Communications, 1969
- Reflectance of evaporated aluminium films in the 1050–1600 Å region, and the influence of the surface plasmonOptics Communications, 1969
- Optical Constants of Vacuum-Evaporated Silver Films*Journal of the Optical Society of America, 1964