Chemical force microscopy of CH3 and COOH terminal groups in mixed self-assembled monolayers by pulsed-force-mode atomic force microscopy
- 1 April 2000
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 157 (4) , 398-404
- https://doi.org/10.1016/s0169-4332(99)00557-7
Abstract
No abstract availableKeywords
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