Surface acoustic wave studies on single-crystal nickel using Brillouin scattering and scanning acoustic microscope
- 15 March 1992
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 71 (6) , 2830-2834
- https://doi.org/10.1063/1.351013
Abstract
The directional dependence (angular dispersion) of surface acoustic phonons propagating on {100}, {110}, and {111} oriented planes of nickel single crystals has been measured by Brillouin scattering and continuous wave scanning acoustic microscope. All the elastic constants C11, C12, C44 are obtained from the angular dispersion of each plane separately. These are compared with the elastic constants determined with conventional ultrasonic measurements on the same specimens. The difference in the sampling depth or the approximate depth of propagation of the acoustic waves into the specimen in each technique is used to characterize the extent of the polish-induced damage zone in the sample.This publication has 10 references indexed in Scilit:
- Polish-induced surface damage in nickel: Scanning acoustic microscopy and Brillouin scattering studyApplied Physics Letters, 1991
- Elastically isotropic Al-Li-Cu quasicrystalSolid State Communications, 1991
- Characterization of crystal surfaces, thin films and superlattices by brillouin scattering from surface acoustic modesSurface and Interface Analysis, 1989
- Material Characterization by Line-Focus-Beam Acoustic MicroscopeIEEE Transactions on Sonics and Ultrasonics, 1985
- Ray-Optical Evaluation of V(z) in the Reflection Acoustic MicroscopeIEEE Transactions on Sonics and Ultrasonics, 1984
- Theory of surface waves in anisotropic cubic crystalsJournal of Physics C: Solid State Physics, 1980
- Brillouin scattering from surface wavesSolid State Communications, 1980
- An angular-spectrum approach to contrast in reflection acoustic microscopyJournal of Applied Physics, 1978
- Light scattering from surface acoustic phonons in metals and semiconductorsSolid State Communications, 1978
- ACOUSTIC SURFACE WAVES ON SILICONApplied Physics Letters, 1969