The measurement of thin films by interferometry
- 31 December 1958
- Vol. 24 (1-5) , 532-537
- https://doi.org/10.1016/s0031-8914(58)96441-3
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Some Considerations Affecting the Design of Interference Microscopes*Journal of the Optical Society of America, 1957
- A Precision Method for Measuring Small Phase Differences*Journal of the Optical Society of America, 1950