Unified treatment of temperature, concentration, and electric-field dependences of variable-range-hopping conductivity

Abstract
The conductivity of Ge1x Aux thin films was studied at temperatures in the range 0.019TxT*/T behavior. The x dependence of T* accurately followed the theory of Shklovskii and Efros, which includes a Coulomb gap in the electronic density of states. At bias fields exceeding ∼104 V/m, nonlinearity was observed that can be accounted for by introducing the effect of the bias field into a calculation of the optimized hopping exponent.

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