Unified treatment of temperature, concentration, and electric-field dependences of variable-range-hopping conductivity
- 15 February 1995
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 51 (8) , 5402-5407
- https://doi.org/10.1103/physrevb.51.5402
Abstract
The conductivity of thin films was studied at temperatures in the range 0.019Tx/T behavior. The x dependence of accurately followed the theory of Shklovskii and Efros, which includes a Coulomb gap in the electronic density of states. At bias fields exceeding ∼ V/m, nonlinearity was observed that can be accounted for by introducing the effect of the bias field into a calculation of the optimized hopping exponent.
Keywords
This publication has 24 references indexed in Scilit:
- Positive and negative magnetoresistance in the variable-range-hopping regime of doped semiconductorsPhilosophical Magazine Part B, 1992
- Non-Ohmic hopping conduction in doped germanium atT<1 KPhysical Review B, 1992
- Dark matter detectionPhysics Reports, 1990
- Electrical and thermal properties of neutron-transmutation-doped Ge at 20 mKPhysical Review B, 1990
- dc conductivity of arsenic-doped silicon near the metal-insulator transitionPhysical Review B, 1989
- Detection of Cosmic Dark MatterAnnual Review of Nuclear and Particle Science, 1988
- Ferroelectric Pb(Zr, Ti)O3 Thin Films Prepared by Metal Target SputteringJapanese Journal of Applied Physics, 1987
- Electronic Properties of Doped SemiconductorsPublished by Springer Nature ,1984
- Correlation effect in variable range hopping in n-InSbSolid State Communications, 1980
- Introductory talk; Conduction in non-crystalline materialsJournal of Non-Crystalline Solids, 1972