Residual phase corrugation in total internal reflection diffraction devices
- 21 June 1975
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 8 (9) , 1159-1162
- https://doi.org/10.1088/0022-3727/8/9/023
Abstract
A study is made of electro-optic total-internal-reflection diffraction device modulator electroding. This can cause reflection phase inequalities which can reduce transmission (zero order) and degrade the extinction ratio. Al, Cu, Au, and Cr electrodes are considered and Al/Cr appears the optimum choice for LiNbO3 devices. A practical LiNbO3/Cr device realization is shown to exhibit a 0.6% insertion loss contribution due to this effect and agrees with theory. Analysis shows that a reflection phase mismatch of 16 degrees adds to insertion loss by 2%, but at 28 degrees (mismatch) this addition rises to 6%. An extinction ratio >100:1 was noted.Keywords
This publication has 4 references indexed in Scilit:
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