Recent american and international developments in the assessment of surface quality and their effect on the future
- 1 November 1979
- Vol. 57 (1) , 17-32
- https://doi.org/10.1016/0043-1648(79)90136-4
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Eight techniques for the optical measurement of surface roughnessPublished by National Institute of Standards and Technology (NIST) ,1973
- Surface microtopographyPhysics Today, 1971