Depth Profiling of Functionalized Silane Films on Quartz and Silicon Substrates and of Urease Immobilized on Such Films by Angle-Resolved X-ray Photoelectron Spectroscopy
- 1 August 1995
- journal article
- Published by American Chemical Society (ACS) in Analytical Chemistry
- Vol. 67 (15) , 2625-2634
- https://doi.org/10.1021/ac00111a021
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