An analysis of X-ray diffraction line profiles using standard deviation as a measure of breadth
- 1 March 1965
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 16 (3) , 323-333
- https://doi.org/10.1088/0508-3443/16/3/306
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
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- The measurement of particle size by the X-ray methodProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1938