A History of the Development and Certification of NIST Glass SRMs 610‐617
- 1 June 1998
- journal article
- Published by Wiley in Geostandards Newsletter
- Vol. 22 (1) , 7-13
- https://doi.org/10.1111/j.1751-908x.1998.tb00541.x
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Measurements of trace elements in basalts and their phenocrysts by laser probe microanalysis inductively coupled plasma mass spectrometry (LPMA-ICP-MS)Published by Elsevier ,1999
- Ultra‐Trace Element Analysis of NIST SRM 616 and 614 using Laser Ablation Microprobe‐Inductively Coupled Plasma‐Mass Spectrometry (LAM‐ICP‐MS): a Comparison with Secondary Ion Mass Spectrometry (SIMS)Geostandards Newsletter, 1997
- Homogeneity of Reference Materials†The Analyst, 1997
- QUANTITATIVE ANALYSIS OF TRACE ELEMENTS IN GEOLOGICAL MATERIALS BY LASER ABLATION ICPMS: INSTRUMENTAL OPERATING CONDITIONS AND CALIBRATION VALUES OF NIST GLASSESGeostandards Newsletter, 1996
- Ion probe measurements of National Institute of Standards and Technology standard reference material SRM 610 glass, trace elementsThe Analyst, 1995
- Ion microprobe trace-element analysis of silicates: Measurement of multi-element glassesChemical Geology, 1990
- Trace determination of rubidium and strontium in silicate glass standard reference materialsAnalytical Chemistry, 1973
- Determination of lead, uranium, thorium, and thallium in silicate glass standard materials by isotope dilution mass spectrometryAnalytical Chemistry, 1973
- Determination of trace elements in silicate matrixes by differential cathode ray polarographyAnalytical Chemistry, 1973
- Determination of trace concentration of boron and uranium in glass by the nuclear track techniqueAnalytical Chemistry, 1972