A comparison of classical and Bayes risks when the quality varies randomly
- 1 April 1992
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 32 (4) , 493-495
- https://doi.org/10.1016/0026-2714(92)90479-5
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A Comparison of Classical and Bayes Producer's RiskTechnometrics, 1986
- Outgoing Quality Distributions for MIL-STD-105D Sampling PlansJournal of Quality Technology, 1981
- The Quality Measurement Plan (QMP)Bell System Technical Journal, 1981