Research into pulsed power-driven recombination lasers
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Plasma Science
- Vol. 16 (5) , 491-496
- https://doi.org/10.1109/27.8955
Abstract
Time-resolved measurements of XUV emissions from recombining Ne and Al plasmas are reported. The DNA/PITHON pulsed-power generator was used to produce hot, dense aluminum and neon plasmas in a Z-pinch configuration. The Al Xl, 4f-3d and 4d-3p lines at 154.4 and 150.4 AA were observed to be anomalously bright compared to the Al Xl, 4d-2p line. This anomaly, which might be suggestive of recombination lasing, may also be explained by opacity, whereby the optically thick 4 to 2 lines are reduced in apparent intensity with respect to the 4 to 3 lines. The Ne X 4-3 line was observed to be spatially localized on axis where emissions from the Ne X 3-2 line were sharply reduced in intensity. On axis, the anomalous brightness of the Ne X 4-3 line suggests a strong inversion.Keywords
This publication has 2 references indexed in Scilit:
- Demonstration of a Soft X-Ray AmplifierPhysical Review Letters, 1985
- Ablation of electrode surfaces in high power diodesJournal of Applied Physics, 1983