Fourier-Transformed Compton Profiles: A Sensitive Probe for the Microstructure of Semiconductors

23 May 1977

journal article
research article
Published by American Physical Society (APS) in Physical Review Letters

Vol. 38 (21) , 1227-1230
https://doi.org/10.1103/physrevlett.38.1227

Abstract

Fourier-transformed experimentally determined valence Compton profiles of trigonal, polycrystalline, and amorphous Se are presented. For trigonal and polycrystalline Se, the experimental results are reproduced quantitatively by a self-consistent orthogonalized-plane-wave calculation. The results are discussed in terms of one- and two-electron densities. Because of the surpriseinly large differences between the amorphous and crystalline results we believe that the Fourier-transformed Compton profile is a powerful probe for the microstructure of semiconductors.

Keywords

This publication has 2 references indexed in Scilit:

Compton profiles of trigonal and amorphous selenium
Solid State Communications, 1977
Fermi surface parameters from the Fourier analysis of Compton profiles
Solid State Communications, 1976