Specular reflection of x rays in the anomalous dispersion region of the silicon K absorption edge
- 1 December 1980
- journal article
- Published by Optica Publishing Group in Optics Letters
- Vol. 5 (12) , 543-545
- https://doi.org/10.1364/ol.5.000543
Abstract
The spectral distribution of continuous x radiation, specularly reflected on a silicon mirror, is determined for various glancing angles near the K absorption edge. Anomalies of reflectivity are revealed, along with fine structure, in the photoabsorption spectrum beyond the edge. They are interpreted by the anomalous behavior of the refractive index in this region. An experimental dispersion curve for the real part of the refractive index is deduced.Keywords
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