Determination of the amorphous content of superconducting films by x-ray diffraction and its relation to transition temperature

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Abstract
A method has been developed for the determination of the amorphous content of superconducting films (niobium‐germanium) based on x‐ray analysis. Measurements are made in reflection using a standard diffractometer which includes a silicon semiconductor counter. The intensity of the diffraction line of the substrate was measured at an angle outside the amorphous halo region of the films to calibrate their surface density. The second angle of measurement was chosen to be within the region of the amorphous halo but away from the diffraction lines of the substrate or crystalline components of the films under investigation. Expression have been derived for calculation of the amorphous content. For the set of films investigated, a direct correlation of the amorphous concentration and the superconducting transition temperature has been observed.