Deterioration of large Ge(Li) diodes caused by fast neutrons
- 1 February 1972
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 98 (3) , 481-484
- https://doi.org/10.1016/0029-554x(72)90232-7
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Principle of formation of amplitude spectra in semiconductor nuclear radiation countersNuclear Instruments and Methods, 1971
- Carrier Trapping in Ge(Li) DetectorsIEEE Transactions on Nuclear Science, 1971
- The effect of charge trapping on the spectrometer performance of p-i-n semiconductor detectorsNuclear Instruments and Methods, 1970
- Spectrum Degradation Effects in Ge(Li) DetectorsIEEE Transactions on Nuclear Science, 1970
- The effects of carrier trapping in semiconductor gamma-ray spectrometersNuclear Instruments and Methods, 1969
- Effects produced by fast neutron bombardment of Ge(Li) gamma ray detectorsNuclear Instruments and Methods, 1968
- Fast neutron bombardment of a lithium-drifted germanium gamma-ray detectorNuclear Instruments and Methods, 1965
- Neutron Spectrum and Absolute Yield of a Plutonium-Beryllium SourcePhysical Review B, 1955