Rotated X-Cut Quartz Resonators for High Temperature Applications

• 1 January 1978
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 255-259
• https://doi.org/10.1109/freq.1978.200245

Abstract

Keywords

• TRANSDUCERS
• FREQUENCY
• ELECTRODES
• TEMPERATURE DISTRIBUTION
• TURNING
• PRESSURE MEASUREMENT
• STRESS
• WELL LOGGING
• TEMPERATURE MEASUREMENT
• US DEPARTMENT OF ENERGY