Direct Measurement of Diffuse Double-Layer Forces at the Semiconductor/Electrolyte Interface Using an Atomic Force Microscope
- 1 October 1997
- journal article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry B
- Vol. 101 (41) , 8298-8303
- https://doi.org/10.1021/jp971887x
Abstract
No abstract availableThis publication has 37 references indexed in Scilit:
- Measuring surface forces in aqueous electrolyte solution with the atomic force microscopeBioelectrochemistry and Bioenergetics, 1995
- Direct Force Measurements between Dissimilar Metal OxidesThe Journal of Physical Chemistry, 1995
- Steric and Bridging Forces between Surfaces Bearing Adsorbed Polymer: An Atomic Force Microscopy StudyLangmuir, 1995
- Effect of Dissolved Gas and Salt on the Hydrophobic Force between Polypropylene SurfacesLangmuir, 1994
- Surface forces between zinc sulfide and mica in aqueous electrolytesLangmuir, 1993
- An atomic force microscope study of grafted polymers on micaLangmuir, 1993
- Adsorption of the poly(oxyethylene) nonionic surfactant C12E5 to silica: a study using atomic force microscopyLangmuir, 1993
- Direct measurement of colloidal forces using an atomic force microscopeNature, 1991
- Ultrathin layer cell for electrochemical and electron transfer measurementsJournal of the American Chemical Society, 1987
- Studies in the Theory of the Polarographic Diffusion Current. V. Effects of Certain Variables on m and the Residual CurrentJournal of the American Chemical Society, 1951