The measurement of strain fields by X-ray topographic contour mapping
- 1 January 1986
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine A
- Vol. 53 (1) , 73-86
- https://doi.org/10.1080/01418618608242808
Abstract
An X-ray topographic method is described for measuring the magnitude of the components of the strain tensor as a function of position in single crystal specimens. Several variants of the technique are described for use with monochromatic or white X-radiation. Results are reported for some components of the deformation field surrounding a precipitate of β-NbH. Possible applications of contour mapping are discussed.Keywords
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