The growth of Ag films on Si(100)

• 1 January 1990
• journal article
• Published by American Vacuum Society in Journal of Vacuum Science & Technology A
• Vol. 8  (1) , 251-254
• https://doi.org/10.1116/1.577078

Abstract

Keywords

• LATTICE PARAMETER
• CRYSTAL GROWTH
• CRYSTAL STRUCTURE
• ROOM TEMPERATURE
• THIN FILM
• ELECTRON DIFFRACTION
• FACE CENTERED CUBIC
• LOW ENERGY ELECTRON DIFFRACTION
• SCANNING TUNNELING MICROSCOPY
• AUGER ELECTRON SPECTROSCOPY