A simple background correction for AES peak height measurements
- 1 October 1982
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 4 (5) , 194-196
- https://doi.org/10.1002/sia.740040504
Abstract
A very simple background correction is described, which largely removes the error introduced by the AES background signal. The correction consists of adding a fixed amount, equal to the change in the background across the AES line, to the measured peak height. The correction is particularly important for the measurement of small coverages of elements displaying AES lines in the low energy range of the spectrum. No computer is necessary. An example concerning C on Ni(100) is given.Keywords
This publication has 4 references indexed in Scilit:
- The adsorption and decomposition of carbon monoxide on Ni(100) and the oxidation of the surface carbide by oxygenSurface Science, 1981
- Surface characterization by Auger electron spectrometryJournal of Vacuum Science and Technology, 1974
- Quantitative Auger spectroscopic analysis of segregation of phosphorus in ironSurface Science, 1973
- A Secondary Emission Analog for Improved Auger Spectroscopy with Retarding Potential AnalyzersReview of Scientific Instruments, 1971