The critical voltage effect in transmission electron microscopy. III. Influence of weak beams on degeneracy
- 1 June 1975
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 69 (2) , 557-567
- https://doi.org/10.1002/pssb.2220690229
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- The critical voltage effect in transmission electron microscopy. II. A theoretical study neglecting absorption effectsPhysica Status Solidi (b), 1975
- The Critical Voltage Effect in Transmission Electron Microscopy. I. Eigenvalue Degeneracy in the Three-Beam CasePhysica Status Solidi (b), 1974
- Perturbation Theory in Transmission Electron Diffraction II. The Perturbing Matrix is Constant but not HermitianPhysica Status Solidi (b), 1973
- Perturbation theory in transmission electron diffraction I. The perturbing matrix is constant and hermitianPhysica Status Solidi (b), 1972