Contribution of surface microscopic phonons to the electron energy-loss spectrum of ionic films on an intrinsic semiconductor
- 1 May 1992
- journal article
- Published by Elsevier in Surface Science
- Vol. 269-270, 141-145
- https://doi.org/10.1016/0039-6028(92)91239-8
Abstract
No abstract availableThis publication has 22 references indexed in Scilit:
- Surface and interface phonons of CaF2 epitaxial layers on Si(111) measured by high resolution electron energy loss spectroscopyJournal of Vacuum Science & Technology A, 1991
- Surface-phonon dispersion of NiAl(110)Physical Review B, 1990
- Effect of complete oxidation on the vibrational properties of aluminum oxide thin films: An electron-energy-loss-spectroscopy studyPhysical Review B, 1990
- Surface-phonon dispersion curves of TiC(100)Physical Review B, 1987
- Ca/Si(111): Thin-film characterization by high-resolution electron-energy-loss spectroscopyPhysical Review B, 1986
- Observation of Long-Wavelength Interface Phonons in a GaAs/AlGaAs SuperlatticePhysical Review Letters, 1986
- Vibrational study of the SiO2/Si interface by high resolution electron energy loss spectroscopyJournal of Vacuum Science & Technology B, 1985
- Experimental observation of microscopic optical surface phonon: TaC(100)Physical Review B, 1984
- Fast-Electron Spectroscopy of Surface ExcitationsPhysical Review Letters, 1971
- Optical Modes of Vibration in an Ionic Crystal SlabPhysical Review B, 1965