Phosphine Dissociation on the Si(001) Surface
- 23 November 2004
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 93 (22) , 226102
- https://doi.org/10.1103/physrevlett.93.226102
Abstract
Density functional calculations are performed to identify features observed in STM experiments after phosphine () dosing of the Si(001) surface. On the basis of a comprehensive survey of possible structures, energetics, and simulated STM images, three prominent STM features are assigned to structures containing surface bound , PH, and P, respectively. Collectively, the assigned features outline for the first time a detailed mechanism of dissociation and P incorporation on Si(001).
Keywords
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