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  3. Abstract: Characterization of InN, In2O3, and In oxy-nitride semiconducting thin films using XPS electron energy loss spectra
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  5. 10.1116/1.570024
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  3. Abstract: Characterization of InN, In2O3, and In oxy-nitride semiconducting thin films using XPS electron energy loss spectra
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  5. 10.1116/1.570024

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