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  3. Direct Observation of the Structure of Thin, Commercially Useful Silicon on Sapphire Films by Cross Section Transmission Electron Microscopy
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  5. 10.1149/1.2133367
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  3. Direct Observation of the Structure of Thin, Commercially Useful Silicon on Sapphire Films by Cross Section Transmission Electron Microscopy
  4. Cited-By
  5. 10.1149/1.2133367

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