A high resolution exafs and near edge study of GeO2 glass
- 1 November 1986
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 87 (3) , 312-320
- https://doi.org/10.1016/s0022-3093(86)80005-9
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Crystalline Ordering in Silica and Germania GlassesScience, 1973
- Structure determination of amorphous Ge, GeO2 and GeSe by fourier analysis of extended x-ray absorption fine structure (EXAFS)Journal of Non-Crystalline Solids, 1972
- Diffraction studies of glass structureJournal of Non-Crystalline Solids, 1972
- The crystal structure of quartz-like GeO2Acta Crystallographica, 1964