Thickness dependence of structure in thin films of low-temperature silver selenide
- 1 February 1993
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 49 (1-4) , 293-307
- https://doi.org/10.1016/0304-3991(93)90236-q
Abstract
No abstract availableThis publication has 30 references indexed in Scilit:
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