Double correlating interferometer scheme for measuring PM and AM noise
- 8 January 1998
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 34 (1) , 93-94
- https://doi.org/10.1049/el:19980129
Abstract
A new scheme is proposed to measure close-to-carrier PM and AM noise by means of correlation between two interferometric measurements. The most relevant feature is the ability to reject interferometric system noise, thus improving the sensitivity. Implementation and experimental results are discussed.Keywords
This publication has 2 references indexed in Scilit:
- Origin of 1/f PM and AM noise in bipolar junction transistor amplifiersIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, 1997
- A study of noise phenomena in microwave components using an advanced noise measurement systemIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, 1997