Ultraviolet damage resistance of dielectric reflectors under multiple-shot irradiation
- 1 October 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 17 (10) , 2092-2098
- https://doi.org/10.1109/jqe.1981.1070666
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Characterization of Small Absorptions in Optical CoatingsPublished by ASTM International ,1981