The Multiplex Disadvantage and Excess Low-Frequency Noise
- 1 September 1987
- journal article
- research article
- Published by SAGE Publications in Applied Spectroscopy
- Vol. 41 (7) , 1182-1184
- https://doi.org/10.1366/0003702874447509
Abstract
Analysis of the performance of a Fourier transform spectrometer with respect to source shot and flicker noises is presented. It was found that source shot noise uniformly distributes throughout the baseline, whereas source flicker noise remains localized about the generating spectral region(s).Keywords
This publication has 3 references indexed in Scilit:
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- Measurement of Inductively Coupled Plasma Emission Spectra Using a Fourier Transform SpectrometerApplied Spectroscopy, 1985
- Hadamard spectrometer for ultraviolet-visible spectrometryAnalytical Chemistry, 1974