Cluster ions. I. Methods
- 1 September 1987
- journal article
- research article
- Published by Wiley in Mass Spectrometry Reviews
- Vol. 6 (3) , 395-442
- https://doi.org/10.1002/mas.1280060303
Abstract
No abstract availableThis publication has 143 references indexed in Scilit:
- Very large metal carbonyl clusters formed by ion/ molecule reactions in decacarbonyldirheniumInternational Journal of Mass Spectrometry and Ion Processes, 1984
- A 252Cf time-of-flight mass spectrometer with improved mass resolutionInternational Journal of Mass Spectrometry and Ion Processes, 1984
- Secondary ion mass spectrometry (SIMS) of metal halides. IV. The envelopes of secondary cluster ion distributionsInternational Journal of Mass Spectrometry and Ion Processes, 1984
- Fast-atom molecular secondary-ion mass spectrometryInternational Journal of Mass Spectrometry and Ion Processes, 1983
- The sputtering of molecular ions from surfaces in secondary ion mass spectrometryApplications of Surface Science, 1982
- A pulsed molecular beam sourceJournal of Physics E: Scientific Instruments, 1981
- The structure of ionic clusters: Thermodynamic functions, energy surfaces, and SIMSThe Journal of Chemical Physics, 1980
- Electrohydrodynamic ionization mass spectrometry: Review of instrumentation, mechanisms and applicationsJournal of Electrostatics, 1978
- Miniature ion sources for analytical instrumentsNuclear Instruments and Methods, 1978
- Strahlen aus kondensierten Atomen und Molekeln im HochvakuumThe European Physical Journal A, 1956