Formation of low-resistance ohmic contacts between carbon nanotube and metal electrodes by a rapid thermal annealing method

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Abstract
The contact resistance between a carbon nanotube and metal electrodes decreases by several orders of magnitude and becomes long-term stable when the nanotube contacted by Ti-Au electrodes was annealed by a rapid thermal annealing method at 600-800 °C for 30 s. The contact resistances of the annealed samples are in the range 0.5-50 kΩ at room temperature, depending on the electrical properties of the nanotube. The short and relatively low-temperature annealing process enables us to make a surface Ti-nanotube contact suitable for electrical measurements. For the samples with relatively low contact resistances (0.5-5 kΩ) at room temperature, the contact resistance remained constant or decreased slightly as the temperature was lowered. Those with a relatively high contact resistance (5-50 kΩ), on the other hand, showed increasing contact resistance with a lowering of the temperature.