Force and conductance jumps in atomic-scale metallic contacts
- 15 November 1996
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 54 (20) , R14234-R14237
- https://doi.org/10.1103/physrevb.54.r14234
Abstract
We have performed dynamic simulations of the pull off of a Au contact at a temperature of 1 K. The conductance and the tensile force on the contact are calculated throughout the pull off. There are prominent jumps both in the conductance and in the force. The force and conductance jumps generally coincide with each other, and correspond to abrupt atomic rearrangements in the contact. The correlation between the force and conductance jumps and the effective spring constant of the contact during pull off are in agreement with recent experiments. © 1996 The American Physical Society.This publication has 19 references indexed in Scilit:
- Conditions for conductance quantization in realistic models of atomic-scale metallic contactsPhysical Review B, 1995
- Comment on "Quantized Conductance in an Atom-Sized Point Contact"Physical Review Letters, 1995
- Quantized conductance in an atom-sized point contactPhysical Review Letters, 1994
- Jumps in electronic conductance due to mechanical instabilitiesPhysical Review Letters, 1993
- Conductance and supercurrent discontinuities in atomic-scale metallic constrictions of variable widthPhysical Review Letters, 1992
- Observation of metallic adhesion using the scanning tunneling microscopePhysical Review Letters, 1990
- Inelastic flow processes in nanometre volumes of solidsJournal of Physics: Condensed Matter, 1990
- Transition from the tunneling regime to point contact studied using scanning tunneling microscopyPhysical Review B, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982