Noise measurement analysis of NPN transistors after gamma irradiation—An investigation for reliability
- 1 January 1981
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 21 (2) , 221-224
- https://doi.org/10.1016/0026-2714(81)90392-9
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Noise analysis study of semiconductor devices for reliability improvementMicroelectronics Reliability, 1978
- Excess Noise in Selected Field-Effect TransistorsIEEE Transactions on Nuclear Science, 1977