Characterization of oxide layers on copper by linear potential sweep voltammetry
- 1 May 1986
- journal article
- Published by Springer Nature in Journal of Applied Electrochemistry
- Vol. 16 (3) , 413-421
- https://doi.org/10.1007/bf01008852
Abstract
No abstract availableKeywords
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- Electrometric Characterization of Tarnish Films on Cu/Zn AlloysNature Physical Science, 1972