Detection of minimum-ionizing particles in hydrogenated amorphous silicon
- 1 December 1988
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 273 (2) , 611-614
- https://doi.org/10.1016/0168-9002(88)90064-2
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Detection of charged particles in amorphous silicon layersNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1986
- Detection of Charged Particles in Amorphous Silicon LayersIEEE Transactions on Nuclear Science, 1986
- Electronic properties of substitutionally doped amorphous Si and GePhilosophical Magazine, 1976
- Bandgap Dependence and Related Features of Radiation Ionization Energies in SemiconductorsJournal of Applied Physics, 1968