Electroluminescence thermal quenching in SrS:Cu thin-film electroluminescent devices

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Abstract
Article appears in Applied Physics Letters (http://apl.aip.org/) and is copyrighted by American Institute of Physics (http://www.aip.org/).Electroluminesence (EL) thermal quenching refers a reduction in luminance, concomitant with a\ud reduction in transferred charge, when an alternating-current thin-film electroluminescent (ACTFEL)\ud device is operated at an elevated temperature. EL thermal quenching is found to be significant in\ud SrS:Cu ACTFEL devices operated above ~60-80 °C. Maximum transferred charge-maximum\ud applied voltage (Qmax-Vmax) and transferred charge capacitance (i.e., dQmax /dVmax vs Vmax)\ud measurements as a function of temperature in conjunction with ACTFEL device simulation are\ud employed in order to establish that EL thermal quenching arises from a thermally activated\ud annihilation of positive space charge and a corresponding increase in the threshold voltage