Digraph Matrix Analysis
- 1 December 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. R-34 (5) , 437-446
- https://doi.org/10.1109/tr.1985.5222226
Abstract
This paper describes a systematic procedure for constructing a Boolean reliability model from plant schematics, and a technique for determining all sets of single and double component failures which will cause system failure. This technique, called digraph matrix analysis, uses a fault graph instead of the more traditional fault tree. Digraph matrix analysis was recently applied to the system interaction analysis of a very large safety system (over ten thousand components) and is being used to determine security system vulnerabilities.Keywords
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