Generation of two-dimensional surface profiles from differential interference contrast (DIC) — images
- 31 December 2001
- Vol. 112 (8) , 363-367
- https://doi.org/10.1078/0030-4026-00063
Abstract
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This publication has 1 reference indexed in Scilit:
- Quantitative surface topography determination by Nomarski reflection microscopy I TheoryJournal of the Optical Society of America, 1979