Microstructure of permalloy and copper films obtained by vapor deposition at various incidence angles
- 1 October 1980
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 72 (2) , 297-303
- https://doi.org/10.1016/0040-6090(80)90011-5
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Columnar microstructure in vapor-deposited thin filmsThin Solid Films, 1977
- Resistivity Anisotropy in Oblique Incidence Evaporated FilmsJapanese Journal of Applied Physics, 1974
- An investigation of the surface self-diffusion of nickelPhysica Status Solidi (a), 1973
- Effect of vapour incidence angles on profile and properties of condensed filmsThin Solid Films, 1972
- The surface self-diffusion of copper as affected by environmentActa Metallurgica, 1964