IGBT module rupture categorization and testing
- 22 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 2, 1259-1266
- https://doi.org/10.1109/ias.1997.629021
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- An advanced applications tool to enhance the fuse protection of power semiconductorsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Electrothermal model of a fusePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002